The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Jun. 04, 2012
Peter N. Belhumeur, New York, NY (US);
David W. Jacobs, Bethesda, MD (US);
David J. Kriegman, San Diego, CA (US);
Neeraj Kumar, Seattle, WA (US);
Peter N. Belhumeur, New York, NY (US);
David W. Jacobs, Bethesda, MD (US);
David J. Kriegman, San Diego, CA (US);
Neeraj Kumar, Seattle, WA (US);
Kriegman-Belhumeur Vision Technologies, LLC, San Diego, CA (US);
Abstract
A method is provided for localizing parts of an object in an image by training local detectors using labeled image exemplars with fiducial points corresponding to parts within the image. Each local detector generates a detector score corresponding to the likelihood that a desired part is located at a given location within the image exemplar. A non-parametric global model of the locations of the fiducial points is generated for each of at least a portion of the image exemplars. An input image is analyzed using the trained local detectors, and a Bayesian objective function is derived for the input image from the non-parametric model and detector scores. The Bayesian objective function is optimized using a consensus of global models, and an output is generated with locations of the fiducial points labeled within the object in the image.