The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Jun. 07, 2013
Applicant:

Litepoint Corporation, Sunnyvale, CA (US);

Inventor:

Minh-Chau Huynh, San Meteo, CA (US);

Assignee:

Litepoint Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2006.01); H04B 17/00 (2006.01); H04Q 1/00 (2006.01); H04B 1/38 (2006.01);
U.S. Cl.
CPC ...
H04B 17/00 (2013.01); H04B 1/38 (2013.01);
Abstract

A method for facilitating wireless testing of a radio frequency (RF) signal transceiver device under test (DUT). Using multiple antennas within a shielded enclosure containing the DUT, multiple wireless RF test signals resulting from a RF test signal radiated from the DUT are captured and their respective signal phases are controlled prior to being combined to form a composite RF signal. This process is repeated until power level differences between signal power levels at respective pairs of a selected number of RF signal frequencies have values between predetermined minimum and maximum values, thereby providing compensation for the multipath signal environment within the shielded enclosure, and thereby simulating a wired test signal path during wireless testing of the DUT.


Find Patent Forward Citations

Loading…