The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Jul. 07, 2010
IN Jae Jung, Anyang-si, KR;
IN Kwon Seo, Anyang-si, KR;
Sang Wook Lee, Anyang-si, KR;
Su Hwan Lim, Anyang-si, KR;
In Jae Jung, Anyang-si, KR;
In Kwon Seo, Anyang-si, KR;
Sang Wook Lee, Anyang-si, KR;
Su Hwan Lim, Anyang-si, KR;
LG Electronics Inc., Seoul, KR;
Abstract
The present invention relates to a method for measuring channel quality information in a system transmitting a signal via a plurality of component carriers. The method comprises the steps of: measuring a channel quality value of at least one component carrier allocated to a terminal from among a plurality of component carriers used to transmit a signal from a serving cell, to which the terminal belongs, to the terminal; comparing the channel quality value with a critical value for determining whether or not a channel quality of a component carrier not allocated to the terminal from among the plurality of component carriers must be derived; and, if the channel quality value is less than the critical value, measuring a channel quality value of a component not allocated to the terminal from among the plurality of component carriers.