The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Mar. 09, 2012
Chiaki Shinohara, Fukuoka, JP;
Kazuhisa Obuchi, Kawasaki, JP;
Yoshiharu Tajima, Kawasaki, JP;
Yoshinori Soejima, Fukuoka, JP;
Manabu Kubota, Fukuoka, JP;
Miki Yamasaki, Fukuoka, JP;
Shinya Okamoto, Fukuoka, JP;
Akihide Otonari, Fukuoka, JP;
Chiaki Shinohara, Fukuoka, JP;
Kazuhisa Obuchi, Kawasaki, JP;
Yoshiharu Tajima, Kawasaki, JP;
Yoshinori Soejima, Fukuoka, JP;
Manabu Kubota, Fukuoka, JP;
Miki Yamasaki, Fukuoka, JP;
Shinya Okamoto, Fukuoka, JP;
Akihide Otonari, Fukuoka, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A measuring unit measures the line quality with an eNB. A receiving unit receives line quality information transmitted from an UE. When the line quality measured by the measuring unit is different from line quality contained in the line quality information received by the receiving unit, a transmitting unit changes, the received target data to data for a layer that is different from the physical layer, and transmits the changed data to the UE.