The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Jul. 01, 2010
Yoshihiro Akimoto, Tokyo, JP;
Shoei Kobayashi, Tokyo, JP;
Motoshi Ito, Kodoma, JP;
Yasumori Hino, Kadoma, JP;
Hiroyasu Inoue, Tokyo, JP;
Harukazu Miyamoto, Tokyo, JP;
Koichiro Nishimura, Totsuka-ku, JP;
Sung-hee Hwang, Suwon-si, KR;
In-oh Hwang, Seongnam-si, KR;
Yoshihiro Akimoto, Tokyo, JP;
Shoei Kobayashi, Tokyo, JP;
Motoshi Ito, Kodoma, JP;
Yasumori Hino, Kadoma, JP;
Hiroyasu Inoue, Tokyo, JP;
Harukazu Miyamoto, Tokyo, JP;
Koichiro Nishimura, Totsuka-ku, JP;
Sung-hee Hwang, Suwon-si, KR;
In-oh Hwang, Seongnam-si, KR;
Sony Corporation, Tokyo, JP;
Panasonic Corporation, Kadoma-shi, JP;
TDK Corporation, Tokyo, JP;
Hitachi Consumer Electronics Co., Ltd., Tokyo, JP;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
The present invention is to realize a proper inner zone layout in a quadruple-layer disk. A test area is provided in the inner zone (inner circumference side area) in each of recording layers. If two test areas closer to the outer circumference, of four test areas, are defined as a first pair and two test areas closer to the inner circumference are defined as a second pair, the test areas of the first pair and the test areas of the second pair are so disposed as to be prevented from overlapping with each other in the layer direction. Two test areas of the first pair have the same consumption direction of the test area, and are so disposed that the areas to be used next hardly overlap with each other in the layer direction. Two test areas of the second pair have the same consumption direction of the test area opposite to the consumption direction of the test area in the first pair, and are so disposed that the areas to be used next hardly overlap with each other in the layer direction.