The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Jun. 11, 2012
Applicants:

Yutaka Terada, Osaka, JP;

Masakazu Kurata, Osaka, JP;

Inventors:

Yutaka Terada, Osaka, JP;

Masakazu Kurata, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/10 (2006.01); H01L 27/112 (2006.01); H01L 27/115 (2006.01); G11C 16/04 (2006.01); G11C 16/06 (2006.01);
U.S. Cl.
CPC ...
H01L 27/112 (2013.01); H01L 27/11519 (2013.01); G11C 16/0408 (2013.01); H01L 27/115 (2013.01); G11C 16/06 (2013.01);
Abstract

In a semiconductor memory device in which each memory cell is constituted by one transistor, in a memory cell pattern, two adjacent bits form one diffusion pattern, two adjacent transistors share a source region, and two drain regions are separated from each other. A plurality of arrays in each of which at least a column of the diffusion patterns is disposed include bit lines, and the bit lines of the first array are independent of the bit lines of the second array. In an interface between the arrays, ends at one side of the bit lines of each of the arrays are located on an associated one of two drain regions which are separated from each other with the source region which is shared on one diffusion pattern sandwiched therebetween. This configuration can provide a sufficient bit-line separation width, and reduce the area.


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