The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Dec. 27, 2012
Applicant:

Lsi Corporation, Milpitas, CA (US);

Inventors:

Shaohua Yang, San Jose, CA (US);

Yoon L. Liow, San Jose, CA (US);

Wu Chang, Sunnyvale, CA (US);

Xuebin Wu, San Jose, CA (US);

Assignee:

LSI Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus are provided for detecting a sync mark in a storage system, such as a hard disk drive. A sync mark is detected in a storage system by obtaining one or more branch metrics from a data detector in the storage system; generating one or more sync mark metrics using the one or more branch metrics from the data detector; and identifying the sync mark based on the sync mark metrics. An input data set is optionally compared with a plurality of portions of a sync mark pattern to yield corresponding comparison values and the comparison values can be summed to obtain at least one result. A sync mark found signal is asserted based upon the at least one result.


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