The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Jun. 16, 2009
Applicants:
Yukiko Hamano, Kawasaki, JP;
Hiroshi Akiyama, Yokohama, JP;
Yoshitaka Takahashi, Noda, JP;
Inventors:
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
An optical scan unit () is configured to include a light source (), a divergent light conversion element () having such positive power as to convert divergent light from the light source () into convergent light to form a spot on a projection plane, an optical deflector () deflecting a light beam from the divergent light conversion element () to a first scan direction and a second scan direction which is orthogonal to the first scan direction, and a deflection angle conversion element() having such negative power as to convert a deflection angle of the light deflected by the optical deflector ().