The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Feb. 20, 2008
Rainer Nebosis, Munich, DE;
Rainer Scheunemann, Munich, DE;
Edgar-gerald Kopp, Merching, DE;
Agfa Healthcare NV, Mortsel, BE;
Abstract
The invention relates to a system and to a corresponding method for optical coherence tomography having an interferometer () for emitting light with which a specimen () is irradiated, the interferometer () comprising a beam splitter () and at least one reflector () the optical distance (I) of which from the beam splitter () is changeable, and a detector () which has a plurality of detector elements arranged in an area by means of which the light which is reflected by the specimen () is collected. In order to simplify and speed up the recording of three-dimensional images of the specimen () provision is made such that the optical distance (I) between the reflector () and the beam splitter () is changed by an optical path (L) which is substantially greater than an average wavelength (λ) of light () which is injected into the interferometer (): L>>λ, during the change of the optical distance (I) between the reflector () and the beam splitter () by the optical path (L) the light reflected by the specimen () being collected a number of times by the detector elements of the detector (), by means of which the light reflected by a number of two-dimensional sections at different depths of the specimen () is collected.