The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Jun. 01, 2009
Applicants:

Markus Eugen Loeffler, Alhambra, CA (US);

Joshua Pines, San Francisco, CA (US);

Chris Kutcka, Pasadena, CA (US);

Inventors:

Markus Eugen Loeffler, Alhambra, CA (US);

Joshua Pines, San Francisco, CA (US);

Chris Kutcka, Pasadena, CA (US);

Assignee:

Thomson Licensing, Issy-les Moulineaux, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/11 (2006.01); H04N 17/02 (2006.01); H04N 5/253 (2006.01); H04N 1/60 (2006.01);
U.S. Cl.
CPC ...
H04N 5/253 (2013.01); H04N 9/11 (2013.01); H04N 17/02 (2013.01); H04N 1/6055 (2013.01);
Abstract

A system and method for calibrating a production film scanner is provided. The system and method provides for providing at least one first calibration frame on an intermediate film stock providing at least one second calibration frame on a negative film stock, scanning the at least first and second calibration frames with a reference film scanner, scanning the at least first and second calibration frames with a production film scanner, and determining a compensation calibration factor from a first result of the scanning with the reference film scanner and a second result of the production film scanner.


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