The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Jul. 15, 2010
Applicants:

Gidon Gershinsky, Haifa, IL;

Liane Lewin-eytan, Binyamina, IL;

Yossi Richter, Kfar-Saba, IL;

Konstantin Shagin, Haifa, IL;

Elad Yom-tov, Mitzpe Hoshaya, IL;

Inventors:

Gidon Gershinsky, Haifa, IL;

Liane Lewin-Eytan, Binyamina, IL;

Yossi Richter, Kfar-Saba, IL;

Konstantin Shagin, Haifa, IL;

Elad Yom-Tov, Mitzpe Hoshaya, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 4/00 (2006.01); G01R 22/06 (2006.01); G01R 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An advanced metering infrastructure comprises intermediate nodes. The intermediate nodes receive data from child nodes and relay a subset of the data that is not according to an expected value. The expected value may be determined based on a forecasting function computed based on past data. The expected value may be a spatial shape in an n-dimension space. A data not within the spatial shape may be considered not in accordance with the expected value. In some case, the spatial shape is defined by a centroid and a radius. The spatial shape may shift over time based on a consumption profile, such as low consumption at noon, and high consumption at evening. The consumption profiles may be determined in a learning phase, as well as shifting of spatial shapes of each group over time.


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