The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Sep. 06, 2011
Applicants:

Jan Ole Blumhagen, Erlangen, DE;

Matthias Fenchel, Erlangen, DE;

Ralf Ladebeck, Erlangen, DE;

Inventors:

Jan Ole Blumhagen, Erlangen, DE;

Matthias Fenchel, Erlangen, DE;

Ralf Ladebeck, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is disclosed for imaging a portion of an examination object in a magnetic resonance scanner. The portion is arranged at the edge of a field of view of the magnetic resonance scanner. During at least one embodiment of the method, a gradient field is produced such that a nonlinearity in the gradient field and a B-field inhomogeneity cancel at a predetermined point at the edge of the field of view. Magnetic resonance data, which contains the predetermined point at the edge of the field of view, is acquired with the aid of the gradient field. An image of the portion of the examination object at the predetermined point is determined from the magnetic resonance data.


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