The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Sep. 27, 2013
Hong Kong Applied Science and Technology Research Institute Company Limited, Hong Kong, HK;
Xiaohua Wu, Hong Kong, HK;
Hong Kong Applied Science and Technology Research Institute Company Limited, Hong Kong Science Park, Shatin, New Territories, Hong Kong, CN;
Abstract
The presently claimed invention provides a focusing apparatus and method for a fluorescence microscope which is capable of shortening the time in focusing, increasing system throughput and avoiding from undesirable photo-bleaching. The fluorescence microscope of the present invention employs a portion of excitation light to form images of a sample to determine a focus plane for fluorescence imaging. As intensity of the portion of the excitation light is much higher than that of fluorescence light, the exposure time is highly reduced for image formation used for focusing purpose. The fluorescence microscope of the present invention enables to perform both predictive focusing and multiplex focusing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile