The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Jan. 11, 2013
Freddy E. Mendez, Kingwood, TX (US);
Gary A. Feuerbacher, Humble, TX (US);
John M. Longo, Houston, TX (US);
Maxim Vasilyev, The Woodlands, TX (US);
Freddy E. Mendez, Kingwood, TX (US);
Gary A. Feuerbacher, Humble, TX (US);
John M. Longo, Houston, TX (US);
Maxim Vasilyev, The Woodlands, TX (US);
Baker Hughes Incorporated, Houston, TX (US);
Abstract
Methods, systems and devices for estimating a parameter of interest from a gamma ray spectrum relating to a volume of matter using standard gamma ray spectra from reference samples, wherein there is at least one non-elemental characteristic that is different between the volume and at least one of the reference samples, wherein the non-elemental characteristic difference affects gamma ray interactions. Methods may include deconvolving a gamma ray spectrum obtained from the analysis volume into a plurality of elemental spectral yields, wherein deconvolution includes compensating for effects of the non-elemental characteristic difference. Methods may include using at least one compensation standard spectrum configured to compensate for the effects of the non-elemental characteristic of the at least one of the reference samples.