The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Sep. 14, 2011
Ronald F. Bonner, Newmarket, CA;
Stephen A. Tate, Barrie, CA;
Rudolf Aebersold, Zurich, CH;
Pedro Jose Navarro Alvarez, Zurich, CH;
Oliver Rinner, Zurich, CH;
Lukas Reiter, Wil, CH;
Ludovic Gillet, Zurich, CH;
Ronald F. Bonner, Newmarket, CA;
Stephen A. Tate, Barrie, CA;
Rudolf Aebersold, Zurich, CH;
Pedro Jose Navarro Alvarez, Zurich, CH;
Oliver Rinner, Zurich, CH;
Lukas Reiter, Wil, CH;
Ludovic Gillet, Zurich, CH;
DH Technologies Development Pte. Ltd., Singapore, SG;
Abstract
Systems and methods are used to store an electronic record of all product ion spectra of all detectable compounds of a sample. A plurality of product ion scans are performed on a tandem mass spectrometer one or more times in a single sample analysis across a mass range using a plurality of mass selection windows. All sample product ion spectra of all detectable compounds for each mass selection window are produced. All sample product ion spectra for each mass selection window are received from the tandem mass spectrometer using a processor. All sample product ion spectra for each mass selection window are stored as an electronic record of all detectable compounds of the sample using the processor. The electronic record is used to characterize compounds known at the time the electronic record is stored or to characterize compounds that became known after the electronic record was stored.