The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Oct. 27, 2011
Applicants:

Alyosha Molnar, Ithaca, NY (US);

Albert Wang, Ithaca, NY (US);

Patrick Gill, Sunnyvale, CA (US);

Inventors:

Alyosha Molnar, Ithaca, NY (US);

Albert Wang, Ithaca, NY (US);

Patrick Gill, Sunnyvale, CA (US);

Assignee:

Cornell University, Ithaca, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); G01J 1/04 (2006.01); G01D 5/38 (2006.01); G02B 27/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

An angle-sensitive pixel (ASP) device that uses the Talbot effect to detect the local intensity and incident angle of light includes a phase grating disposed above a photodiode assembly or a phase grating disposed above an analyzer grating that is disposed above a photodiode assembly. When illuminated by a plane wave, the upper grating generates a self-image at a selected Talbot depth. Several such structures, tuned to different incident angles, are sufficient to extract local incident angle and intensity. Arrays of such structures are sufficient to localize light sources in three dimensions without any additional optics.


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