The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Nov. 26, 2010
Applicants:

Hideyoshi Kinoshita, Kagoshima, JP;

Katsuhiro Hanaki, Satsumasendai, JP;

Inventors:

Hideyoshi Kinoshita, Kagoshima, JP;

Katsuhiro Hanaki, Satsumasendai, JP;

Assignee:

Kyocera Corporation, Kyoto, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23B 5/14 (2006.01); B21D 39/00 (2006.01); B32B 15/04 (2006.01); B32B 19/00 (2006.01); B24D 3/02 (2006.01); B23P 15/28 (2006.01); C22C 29/02 (2006.01); B22F 3/10 (2006.01);
U.S. Cl.
CPC ...
B22F 3/101 (2013.01); C22C 29/02 (2013.01); B23C 2222/16 (2013.01); B22F 3/1017 (2013.01); B23B 2222/16 (2013.01); B22F 2999/00 (2013.01); B22F 2203/11 (2013.01); B22F 2207/01 (2013.01);
Abstract

A sintered cermet of a rotary tool has a hard phase with a first hard phase and a second hard phase comprising a carbide, a nitride, and a carbonitride of at least one of group 4, 5, and 6 metals of the periodic table of which metals the metal titanium is a main component. The result of an X-ray diffraction measurement in a surface region of the sintered cermet provides a first peak intensity Ib on a high angle side that is attributable to a (220) plane of the first hard phase and a second peak intensity Ia on a low-angle side that is attributable to a (220) plane of the second hard phase, and an intensity ratio Ib/Ia of the first peak intensity Ib to the second peak intensity Ia is in the range of 0.5 to 1.5.


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