The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Sep. 17, 2010
Yoshitaka Kimura, Sendai, JP;
Nobuo Yaegashi, Sendai, JP;
Mitsuyuki Nakao, Sendai, JP;
Takuya Ito, Sendai, JP;
Yoshitaka Kimura, Sendai, JP;
Nobuo Yaegashi, Sendai, JP;
Mitsuyuki Nakao, Sendai, JP;
Takuya Ito, Sendai, JP;
Tohoku University, Miyagi, JP;
Abstract
A signal extracting apparatus is provided based on independent component analysis with reference for a single measured signal as a signal processing technique that allows stable and quick extraction of a target signal from single measured signal even in a high-noise environment with a high noise ratio against a target signal to be extracted. The signal extracting apparatus includes: a single-signal measuring unit to measure a measured signal as a single time-series signal containing a target signal obtained by measurement by a single channel; a reference signal creating unit () to create a reference signal provided with timing-axis information based on the time-series signal obtained by the single-signal measuring unit; and a main processing unit () to perform independent component analysis with reference for a single measured signal by capturing the reference signal obtained by the reference signal creating unit () and providing the timing-axis information for an algorithm in a reference system to extract an independent component.