The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Jun. 26, 2008
Srinibas Maharana, Bangalore, IN;
Manu J. Prakash, Bangalore, IN;
Hong Zeng, Cary, NC (US);
Sachin Vasudeva, Fremont, CA (US);
Tao Deng, Sunnyvale, CA (US);
Srinibas Maharana, Bangalore, IN;
Manu J. Prakash, Bangalore, IN;
Hong Zeng, Cary, NC (US);
Sachin Vasudeva, Fremont, CA (US);
Tao Deng, Sunnyvale, CA (US);
Juniper Networks, Inc., Sunnyvale, CA (US);
Abstract
Static analysis of software code may be performed in a selective regression testing framework. The static impact analysis, when carried out in a comprehensive and efficient way, can help make the test selection safer and more complete. One method for performing static analysis in selective regression testing of a software project includes, for example, storing changes to source code that defines functions and global data elements of the software project; performing a static analysis of the source code to determine which global data elements in the source code correspond to changed functions in the source code and executing a regression test of the software project using a set of test units determined based, at least in part, on the static analysis.