The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2014

Filed:

Jun. 29, 2009
Applicants:

Satish Chandra, White Plains, NY (US);

Pankaj Dhoolia, Uttar Pradesh, IN;

Mangala Gowri, Iii, New Delhi, IN;

Monika Gupta, New Delhi, IN;

Rudrapatna Kallikote Shyamasundar, Mumbai, IN;

Saurabh Sinha, New Delhi, IN;

Inventors:

Satish Chandra, White Plains, NY (US);

Pankaj Dhoolia, Uttar Pradesh, IN;

Mangala Gowri, III, New Delhi, IN;

Monika Gupta, New Delhi, IN;

Rudrapatna Kallikote Shyamasundar, Mumbai, IN;

Saurabh Sinha, New Delhi, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for static code analysis are provided. The techniques include routing a code analysis request to a set of one or more static code analysis tools based on a context of the request, merging one or more tool-specific outputs of the code analysis, wherein merging the one or more tool-specific outputs comprises using one or more tool-specific mappings to one or more static code analysis abstractions and one or more source linkages of one or more static code analysis defects, performing a deep analysis on a set of one or more defect categories, and combining results of the merging with the deep analysis to filter out one or more false-positives and to add one or more new true positives to create an optimal set of defects.


Find Patent Forward Citations

Loading…