The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Oct. 27, 2011
Frank Brunswig, Heidelberg, DE;
Udo Klein, Maximiliansau, DE;
Michael Meyringer, Rauenberg, DE;
Tim Gaiser, Sinsheim, DE;
Holger Handel, Mannheim, DE;
Frank Renkes, Rauenberg, DE;
Frank Brunswig, Heidelberg, DE;
Udo Klein, Maximiliansau, DE;
Michael Meyringer, Rauenberg, DE;
Tim Gaiser, Sinsheim, DE;
Holger Handel, Mannheim, DE;
Frank Renkes, Rauenberg, DE;
SAP AG, Walldorf, DE;
Abstract
Local dependency metadata can be collected from local metadata repositories of a plurality of development systems in a layered development system landscape, and a global where-used list that includes intra-layer and inter-layer dependencies between development entities in a layered development system landscape can be created, for example by aggregating the collected local dependency data. A usage metric quantifying how frequently each development entity is depended upon by other development entities in the layered development system landscape can be assigned to each development entity in the layered development system landscape. A measure of a relative effect of a change to one of the development entities on other development entities in the layered development system landscape can be promoted.