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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8806418 B1

PDFFull Text
Date of Patent:
Aug. 12, 2014

Filed:

Jun. 19, 2013

Scaled sigma sampling

Applicants:

Srinivas Jallepalli, Austin, TX (US);

Earl K. Hunter, Gilbert, AZ (US);

Elie A. Maalouf, Mesa, AZ (US);

Venkataram M. Mooraka, Austin, TX (US);

Sanjay R. Parihar, Austin, TX (US);

Inventors:

Srinivas Jallepalli, Austin, TX (US);

Earl K. Hunter, Gilbert, AZ (US);

Elie A. Maalouf, Mesa, AZ (US);

Venkataram M. Mooraka, Austin, TX (US);

Sanjay R. Parihar, Austin, TX (US);

Assignee:

Freescale Semiconductor, Inc., Austin, TX (US);

Attorney:
Primary Examiner:

Jack Chiang

Assistant Examiner:

Magid Dimyan

Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method can include generating a first set of sample values for input variables in accordance with a prescribed set of probability distributions, running a set of simulations on an electronic component based upon the first set of sample values, multiplying the standard deviations of the original distributions by a scaling factor λ, generating a second set of sample values for the input variables based on the probability distributions thus generated, and running a set of simulations on the electronic component based on this second set of sample values. The method can also include the generation of Q-Q plots based on the data from the first and second set of simulations and data from a truly normal distribution or the distribution obeyed by the independently varying input parameters; and the use of these plots for assessment of the robustness and functionality of the electronic component.

Find Patent Forward Citations

Jallepalli, Srinivas. (2014). Scaled sigma sampling (U.S. Patent No. 8806418). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8806418

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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