The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2014

Filed:

Sep. 17, 2013
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Raashid Moin Shaikh, Bangalore, IN;

Vishnuraj Arukat Rajan, Kerala, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of manufacturing semiconductor circuits seeks timing closure on a preliminarily select, placed and routed set of cells using a delay for each cell as derated by a derate value obtained from a timing model table having a derate value corresponding to a circuit path depth in the netlist. The derate value for a predetermined number of circuit path depths below k are identical. The derate values are monotonically decreasing for increasing circuit depths in a range between 1.0 and 1.5. Separate timing model tables with differing identical values can be employed for standard and clock tree cells.


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Shaikh, Raashid. (2014). Gradient aocv methodology enabling graph-based timing closure with aocv timing models (U.S. Patent No. 8806413). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8806413

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