The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Dec. 07, 2010
Reza B'far, Huntington Beach, CA (US);
Yasin Cengiz, Irvine, CA (US);
Tsai-ming Tseng, Irvine, CA (US);
Fei Wihardjo, Austin, TX (US);
Huyvu Nguyen, Orange, CA (US);
Elizabeth Lingg, Brooklyn, NY (US);
Sreedhar Chitullapally, Irvine, CA (US);
Alan Waxman, Morganville, NJ (US);
Steven Miranda, Hillsborough, CA (US);
Christopher Leone, Pleasanton, CA (US);
Reza B'Far, Huntington Beach, CA (US);
Yasin Cengiz, Irvine, CA (US);
Tsai-Ming Tseng, Irvine, CA (US);
Fei Wihardjo, Austin, TX (US);
Huyvu Nguyen, Orange, CA (US);
Elizabeth Lingg, Brooklyn, NY (US);
Sreedhar Chitullapally, Irvine, CA (US);
Alan Waxman, Morganville, NJ (US);
Steven Miranda, Hillsborough, CA (US);
Christopher Leone, Pleasanton, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques, including systems and methods, for generating data are disclosed and suggested herein. Original data used in connection with one or more applications is analyzed in order to determine one or more distribution characteristics for the original data. The distribution characteristics are used to generate data that is similarly distributed. The generated data may be used as seed data for demonstrating, testing, or otherwise using one or more applications.