The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Mar. 03, 2011
Shih-fang Wong, Tu-Cheng, TW;
Xin LU, Shenzhen, CN;
Fei Wang, Shenzhen, CN;
Peng Tang, Shenzhen, CN;
Jia-hong Yang, Shenzhen, CN;
Hui-feng Liu, Shenzhen, CN;
Shih-Fang Wong, Tu-Cheng, TW;
Xin Lu, Shenzhen, CN;
Fei Wang, Shenzhen, CN;
Peng Tang, Shenzhen, CN;
Jia-Hong Yang, Shenzhen, CN;
Hui-Feng Liu, Shenzhen, CN;
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
A method testing the quality of products applied to a system is provided. Each product includes a unique identification number. The system includes a data storage device and test devices. The data storage device includes a first table recording identification numbers, test types, and test results, each test device stores a second table records the identification numbers and the test types. The method includes: obtaining the identification number; obtaining the test type; determining whether a test type previous to the test type exists; and generating first information to prompt the operator to return the to-be-tested product to the workstation of previous test type when the test result corresponding to the existed previous test type does not exist or the test result corresponding to the existed previous test type is a first value.