The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Jan. 31, 2011
Akinori Izaki, Ibaraki, JP;
Yuu Sugimoto, Ibaraki, JP;
Seiji Umemoto, Ibaraki, JP;
Tetsushi Kunitake, Ibaraki, JP;
Akinori Izaki, Ibaraki, JP;
Yuu Sugimoto, Ibaraki, JP;
Seiji Umemoto, Ibaraki, JP;
Tetsushi Kunitake, Ibaraki, JP;
Nitto Denko Corporation, Ibaraki-shi, JP;
Abstract
Provided are a cutting information determination method that can use a simpler process to improve yield, and a strip-shaped polarizing sheet manufacturing method using such a method, an optical display unit manufacturing method using such a method, a strip-shaped polarizing sheet, and a polarizing sheet material. A cutting position in the width direction A, in which a polarizing sheet material MP is to be cut along its longitudinal direction A, is determined based on the numbers of defects counted with respect to plural points in the width direction Aof the polarizing sheet material MP. This makes it possible to determine the cutting position in such a way that a region with many defects does not fall within the cut width, so that a higher-yield cutting position can be determined. The cutting position can also be determined using a simple process in which defects are counted with respect to plural points in the width direction A