The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2014

Filed:

Jul. 12, 2011
Applicants:

Shotaro Moriya, Tokyo, JP;

Hideki Yoshii, Tokyo, JP;

Inventors:

Shotaro Moriya, Tokyo, JP;

Hideki Yoshii, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00 (2013.01);
Abstract

An image processing apparatus has an image analyzer including a feature detector, a feature combiner, and a resolution discrimination signal generator. For each pixel in a prescribed area of an input image, the feature detector outputs a representative difference value obtained from the pixel values of pixels positioned, with reference to that pixel, at prescribed intervals. The feature combiner outputs a combined feature value obtained from the representative difference values obtained for each pixel in the described area. The resolution discrimination signal generator outputs a resolution discrimination signal obtained from the combined feature value. The resolution discrimination signal has a monotonic non-decreasing relationship to the combined feature value. The resolution discrimination signal indicates an extent to which the input image includes signal components with frequencies equal to or greater than a particular frequency determined by the prescribed intervals.


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