The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2014

Filed:

May. 03, 2011
Applicants:

Ludovic Chotard, Saint Egrève, FR;

Michel Sanches, Le Pont de Claix, FR;

Vitor Schwambach, Recife, BR;

Mahesh Chandra, Uttar Pradesh, IN;

Inventors:

Ludovic Chotard, Saint Egrève, FR;

Michel Sanches, Le Pont de Claix, FR;

Vitor Schwambach, Recife, BR;

Mahesh Chandra, Uttar Pradesh, IN;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention concerns a method of performing, by an image processing device, object detection in an image comprising: performing one or more tests of a test sequence for detection of a first object on pixels values of a plurality of at least partially overlapping sub-regions () of a first search window (); generating a cumulative score based on results of said one or more tests on said plurality of sub-regions; comparing said cumulative score with a threshold value; and based on said comparison, selectively performing one or more of said tests of said test sequence on at least one further sub-region of said first search window, said at least one further sub-region at least partially overlapping each of said plurality of sub-regions.


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