The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2014

Filed:

Feb. 09, 2004
Applicants:

Jens Von Berg, Hamburg, DE;

Michael Kaus, Hamburg, DE;

Inventors:

Jens Von Berg, Hamburg, DE;

Michael Kaus, Hamburg, DE;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

Quantification of metric or functional parameters often requires image segmentation. A crucial part of such method is the model of the surface characteristics of the object of interest (features), which drives the deformable surface towards the object boundary in the image. According to the present invention, sections of the mesh are assigned to different classes for different features. According to the present invention, the assignment of mesh sections to the classes is adapted by using actual feature information from the unseen image. Advantageously, this allows for an adaptation of the feature category to which the mesh section is assigned and thereby allows an improved segmentation of the object.


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