The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Jan. 20, 2012
Allen Olson, San Diego, CA (US);
Dirk G. Soenksen, Carlsbad, CA (US);
Kiran Saligrama, San Diego, CA (US);
Allen Olson, San Diego, CA (US);
Dirk G. Soenksen, Carlsbad, CA (US);
Kiran Saligrama, San Diego, CA (US);
Leica Biosystems Imaging, Inc., Vista, CA (US);
Abstract
Systems and methods for assessing and optimizing virtual microscope slide image quality are provided. In order to determine whether any of multiple virtual slide images has an out of focus area and is therefore a candidate for manual inspection or rescanning, various focus points used to scan each virtual slide image are used to calculate a best fit surface for each virtual slide image. The best fit surface is then used to determine whether any of the various focus points are outliers. If it is determined that a virtual slide image is associated with outlying focus points, it is identified as a candidate for manual inspection or rescanning.