The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Apr. 19, 2012
Paul Chan, Sunnyvale, CA (US);
Keith W. Hartman, Redwood City, CA (US);
Paul Chan, Sunnyvale, CA (US);
Keith W. Hartman, Redwood City, CA (US);
Hologic, Inc., Marlborough, MA (US);
Abstract
Methods, systems, and related computer program products for computer-aided detection (CAD) of anatomical abnormalities in digital (or digitized) x-ray mammograms are described. The inventive techniques are based on using a foundational CAD processing algorithm that is characterized by at least one of non-shift-invariance, non-rotational-invariance, and non-inversional-invariance. According to one preferred embodiment, a first x-ray mammogram image of a breast is received, and at least one altered version thereof is generated that differs therefrom by at least one of image shift, image rotation, and image inversion. The first x-ray mammogram image and each of the at least one altered versions thereof are individually processed using the foundational CAD algorithm to generate a respective plurality of individual CAD detection sets. The plurality of CAD detection sets are then compared to generate an overall CAD detection set.