The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Mar. 18, 2010
Applicants:
Hyun-soo Park, Seoul, KR;
Kyung-geun Lee, Seongnam-si, KR;
In-oh Hwang, Seongnam-si, KR;
Hui Zhao, Suwon-si, KR;
Jong-hyun Shin, Suwon-si, KR;
Inventors:
Hyun-soo Park, Seoul, KR;
Kyung-geun Lee, Seongnam-si, KR;
In-oh Hwang, Seongnam-si, KR;
Hui Zhao, Suwon-si, KR;
Jong-hyun Shin, Suwon-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
H04B 17/0057 (2013.01);
Abstract
A signal quality measuring apparatus includes a binary signal generating unit to generate a binary signal from an input signal; a level information extracting unit to extract level information from a relationship between the input signal and the binary signal using at least two window lengths; and a quality calculating unit to calculate a quality of the input signal based on the level information.