The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Oct. 05, 2011
Fritz Strahle, Heubach, DE;
Christoph Hauger, Aalen, DE;
Fritz Strahle, Heubach, DE;
Christoph Hauger, Aalen, DE;
Carl Ziess Meditec AG, Jena, DE;
Abstract
A microscope system for imaging of an object that can be placed in an object plane of a microscope system includes an imaging system for providing at least one pair of optical imaging paths that include a stereoscopic angle in the object plane. The imaging system includes a first subsystem comprising a first plurality of optical lenses that are commonly traversed by both optical imaging paths of the at least one pair of optical imaging paths. The imaging system also includes a second subsystem comprising a second plurality of optical lenses that are traversed by only one optical imaging path. At least two optical lenses of the first plurality of optical lenses and at least two optical lenses of the second plurality of optical lenses are displaceable relative to one another along a common optical imaging path to respectively vary a magnification of the representation of the object.