The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Apr. 13, 2011
Norikazu Sugiyama, Hamamatsu, JP;
Takuji Kataoka, Hamamatsu, JP;
Takahiro Ikeda, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
A cell observation device is provided with a reflection interference measurement light source, a quantitative phase measurement light source, a reflection interference detection camerawhich images light emitted from the reflection interference measurement light sourceand reflected from cells, to generate a reflection interference image, a quantitative phase detection camerawhich images light emitted from the quantitative phase measurement light sourceand transmitted by the cells, to generate a quantitative phase image, an image alignment unitwhich matches a spatial position of the reflection interference image with a spatial position of the quantitative phase image, to implement alignment between the two images, a first extraction unitwhich extracts a first parameter from the reflection interference image in alignment with the quantitative phase image, and a second extraction unitwhich extracts a second parameter from the quantitative phase image in alignment with the reflection interference image.