The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2014

Filed:

Oct. 28, 2010
Applicants:

Yoshinori Ohashi, Tokyo, JP;

Tsuyoshi Oobayashi, Tokyo, JP;

Inventors:

Yoshinori Ohashi, Tokyo, JP;

Tsuyoshi Oobayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
Abstract

[Object] To provide a contact operation determination apparatus, a contact operation determination method, and a program that are capable of avoiding erroneous determination in an end portion of a contact detection area. [Solution] A contact operation determination apparatus includes a display panel, a touch panelconfigured to detect a contact operation for a contact detection areaprovided on the display panel surface, an area setting unit configured to set, in the contact detection area, a first area, and a second areathat surrounds the first area second areaso as to have a width greater than or equal to a predetermined distance D from a contact starting point SP to contact end points EP and EP', the first area second areabeing used to discriminate between a tap operation and a flick operation, and an operation determination unit configured to determine, when a contact end point is detected in the first or second area after a contact starting point has been detected in the second area, that a flick operation has been performed.


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