The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Jan. 13, 2010
Simon Hüttinger, Erlangen, DE;
Thomas Komma, Ottobrunn, DE;
Kai Kriegel, München, DE;
Jürgen Rackles, Puchheim, DE;
Gernot Spiegelberg, Bad Abbach, DE;
Simon Hüttinger, Erlangen, DE;
Thomas Komma, Ottobrunn, DE;
Kai Kriegel, München, DE;
Jürgen Rackles, Puchheim, DE;
Gernot Spiegelberg, Bad Abbach, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method and a circuit functionally test a semiconductor component. The functional test is performed with galvanic isolation by using a transformer. The test itself is based on determining the frequency-dependent impedance of a series circuit of capacitors and inductors using the semiconductor component itself. The impedance is strongly influenced by the conduction state of the semiconductor component, in other words, by the instantaneous conductivity or blocking capability of the semiconductor component.