The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2014

Filed:

Jul. 24, 2008
Applicant:

Thomas Zelder, Luneburg, DE;

Inventor:

Thomas Zelder, Luneburg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 27/32 (2006.01); G01R 31/312 (2006.01); G01R 31/28 (2006.01); G01R 1/24 (2006.01); G01R 35/00 (2006.01); G01R 31/315 (2006.01);
U.S. Cl.
CPC ...
G01R 27/32 (2013.01); G01R 31/312 (2013.01); G01R 31/2822 (2013.01); G01R 1/24 (2013.01); G01R 35/005 (2013.01); G01R 31/315 (2013.01);
Abstract

A contactless measuring system having at least one test probe forming part of a coupling structure for the contactless decoupling of a signal running on a signal waveguide, wherein the signal waveguide is designed as a conductor of the electric circuit on a circuit board and as part of an electric circuit. To this end, at least one contact structure is configured and disposed on the circuit board such that said contact structure is galvanically separated from the signal waveguide, forms part of the coupling structure, is displaced completely within the near field of the signal waveguide, and has at least one contact point, which may be electrically contacted by a contact of the test probe.


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