The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Dec. 14, 2009
Takashi Hibino, Narita, JP;
Takashi Fujimoto, Narita, JP;
Keisuke Komatsu, Narita, JP;
Yoshiyuki Nakao, Osaka, JP;
Makoto Takata, Osaka, JP;
Makoto Sakamoto, Osaka, JP;
Takashi Hibino, Narita, JP;
Takashi Fujimoto, Narita, JP;
Keisuke Komatsu, Narita, JP;
Yoshiyuki Nakao, Osaka, JP;
Makoto Takata, Osaka, JP;
Makoto Sakamoto, Osaka, JP;
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Abstract
In an eddy current testing method which involves using a rotatable eddy current testing probe in which a detection coil is arranged within an exciting coil, a change in detection sensitivity (a deviation of detection sensitivity) which changes depending on the rotational position of the detection coil is reduced. The eddy current testing probe includes an exciting coil EC, a detection coil DC, an exciting coil ECand a detection coil DC, which are mounted on a disk DS. The eddy current testing probe is placed so as to face a circumferential surface of an object to be inspected T, which is in the shape of a circular cylinder, and the disk DS is rotated. Then, the distance (liftoff) between the detection coils DCand DCand an inspection surface changes. Therefore, also the detection sensitivity to a flaw signal changes. To reduce the change in detection sensitivity, the detection sensitivity is adjusted by detecting the rotational position (rotational angle) of the detection coils DCand DC