The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2014

Filed:

Sep. 26, 2008
Applicants:

Tatsuya Narikawa, Kobe, JP;

Tomohiro Tsuji, Kobe, JP;

Keiko Moriyama, Kobe, JP;

Yuji Itose, Kako-gun, JP;

Shinichiro Oguni, Kobe, JP;

Ayumu Yoshida, Kobe, JP;

Saori Suzuki, Kobe, JP;

Toshihiro Mizukami, Kobe, JP;

Inventors:

Tatsuya Narikawa, Kobe, JP;

Tomohiro Tsuji, Kobe, JP;

Keiko Moriyama, Kobe, JP;

Yuji Itose, Kako-gun, JP;

Shinichiro Oguni, Kobe, JP;

Ayumu Yoshida, Kobe, JP;

Saori Suzuki, Kobe, JP;

Toshihiro Mizukami, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe-shi, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); C12Q 1/70 (2006.01); C12Q 1/68 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a reagent kit for analyzing a sample comprising a first reagent containing a cationic surfactant, a nonionic surfactant and an aromatic carboxylic acid and a second reagent containing a fluorescent dye capable of staining nucleic acid, and a method for analyzing a sample using the kit.


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