The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2014

Filed:

Mar. 27, 2007
Applicants:

Rajiv Chopra, Toronto, CA;

Michael Bronskill, Toronto, CA;

Kee Tang, Mississauga, CA;

Inventors:

Rajiv Chopra, Toronto, CA;

Michael Bronskill, Toronto, CA;

Kee Tang, Mississauga, CA;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 18/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method and apparatus for monitoring a thermal effect of a conformal thermal treatment to diseased tissue in a target volume. The method includes acquiring a reference image of the volume containing the diseased tissue at a first position of the device, determining a baseline temperature distribution of the reference image, acquiring an image of the volume containing the diseased tissue while delivering a treatment to the volume, performing a phase subtraction between the image and the reference image to determine a change in phase between the image and the reference image and determining a current spatial temperature distribution in the volume containing the diseased tissue.


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