The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Apr. 23, 2011
Martin Hacker, Jena, DE;
Rudolf Murai Von Bünau, Jena, DE;
Burkhard Wagner, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A system for the improved imaging of eye structures based on optical coherence tomography. The system includes an interferometric measuring arrangement, which has an optical element arranged in the measurement arm or reference arm for influencing the polarization state of the light before the light is interferometrically superimposed, a scanning unit arranged in the measurement arm for implementing OCT scans, a detector for recording the produced interference pattern, and an evaluating and documenting unit. At least two different polarization states of the light are produced. The interference patterns produced in the interferometric measuring arrangement are recorded and forwarded to the evaluating and documenting unit which reconstructs OCT scans from the transmitted interference patterns, combines the OCT scans, and presents and/or stores the resulting OCT signals. The system can be used for pachymetry in addition to the pre- and post-operative imaging for analysis and measurement.