The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Jan. 12, 2012
Toru Nishida, Kanagawa, JP;
Takeshi Zengo, Kanagawa, JP;
Toru Nishida, Kanagawa, JP;
Takeshi Zengo, Kanagawa, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
An image position inspecting apparatus includes a reading unit, a generating unit and a specifying unit. The reading unit includes light receiving elements arranged with a reading resolution Rs and reads an inspection image. The generating unit generates a profile based on the read inspection image. The specifying unit acquires a position of the center of gravity of the pixels of the inspection image with respect to the light receiving elements from the profile and specifies a position of each of the pixels of the inspection image based on a phase difference which is a deviation of the acquired position of the center of gravity of the pixels with respect to a light receiving center of the light receiving elements. A resolution of the inspection image is Rp. The reading resolution Rs and the resolution Rp satisfy the following equation. And, m is a positive integer. Rp·((m+1)/2)<Rs<Rp·((m+2)/2).