The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Jul. 21, 2011
Bing-jun Zhang, Shenzhen, CN;
Bing-Jun Zhang, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
A deformation testing device includes a base holding a workpiece and a testing machine arranged on the base. The testing machine includes a distance-measurement device and a force-applying device. The distance-measurement device includes a distance meter metering a moving distance of an elastic portion of the workpiece and includes a measurement probe. The force-applying device includes a force meter and a transmission member. The force meter slidably is mounted on the base and includes a force-applying post. The transmission member includes a first post and a second post secured to the first post. The first post is aligned with the force-applying post transmits a force from the force-applying post to the elastic portion. The measurement probe abuts against the second post. The force meter applies and measures a force acted upon the elastic portion through the force-applying post and the first post.