The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Dec. 29, 2011
Helen S. Raizen, Jamaica Plain, MA (US);
Michael E. Bappe, Loveland, CO (US);
Harold M. Sandstrom, Belmont, MA (US);
Vinay G. Rao, Karnataka, IN;
Nihar R. Panda, Karnataka, IN;
Helen S. Raizen, Jamaica Plain, MA (US);
Michael E. Bappe, Loveland, CO (US);
Harold M. Sandstrom, Belmont, MA (US);
Vinay G. Rao, Karnataka, IN;
Nihar R. Panda, Karnataka, IN;
EMC Corporation, Hopkinton, MA (US);
Abstract
A technique oversees a path between a multipathing driver of a host computer and a volume of a data storage array. The technique involves, while the multipathing driver of the host computer sends input/output requests (IOs) to the volume of the data storage array on the path, generating an IOs-Over-Period metric based on outcomes of the IOs, the IOs-Over-Period metric providing a measure of IOs per failure over a period of path operation. The technique further involves performing a comparison operation which compares the IOs-Over-Period metric to a predefined flaky path range having a predefined lower limit and a predefined upper limit. The technique further involves, after performing the comparison operation, outputting a detection signal indicating that the path is (i) flaky when the IOs-Over-Period metric falls within the predefined flaky path range and (ii) non-flaky when the IOs-Over-Period metric falls outside of the predefined flaky path range.