The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Aug. 31, 2012
Joo Young Lee, Daejeon, KR;
Youn Hee Gil, Daejeon, KR;
DO Won Hong, Daejeon, KR;
Keon Woo Kim, Daejeon, KR;
Young Soo Kim, Daejeon, KR;
Sung Kyong Un, Daejeon, KR;
Sang Su Lee, Daejeon, KR;
Su Hyung JO, Daejeon, KR;
Woo Yong Choi, Daejeon, KR;
Hyun Sook Cho, Daejeon, KR;
Joo Young Lee, Daejeon, KR;
Youn Hee Gil, Daejeon, KR;
Do Won Hong, Daejeon, KR;
Keon Woo Kim, Daejeon, KR;
Young Soo Kim, Daejeon, KR;
Sung Kyong Un, Daejeon, KR;
Sang Su Lee, Daejeon, KR;
Su Hyung Jo, Daejeon, KR;
Woo Yong Choi, Daejeon, KR;
Hyun Sook Cho, Daejeon, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
Provided is a forensic index method by distributed processing, including: generating data to be divided by dividing data to be indexed according to predetermined division setting for distributed processing; allocating the generated data to be divided to a plurality of data processing units according to the predetermined division setting, extracting an index by filtering the allocated data to be divided in the plurality of data processing units, and generating divided index data including the extracted index; and generating an index database by merging the generated divided index data.