The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Jun. 23, 2011
Geoffrey Stowe, San Francisco, CA (US);
Chris Fischer, Somerville, MA (US);
Paul George, New York, NY (US);
Eli Bingham, New York, NY (US);
Rosco Hill, Palo Alto, CA (US);
Geoffrey Stowe, San Francisco, CA (US);
Chris Fischer, Somerville, MA (US);
Paul George, New York, NY (US);
Eli Bingham, New York, NY (US);
Rosco Hill, Palo Alto, CA (US);
Palantir Technologies, Inc., Palo Alto, CA (US);
Abstract
A data analysis system is proposed for providing fine-grained low latency access to high volume input data from possibly multiple heterogeneous input data sources. The input data is parsed, optionally transformed, indexed, and stored in a horizontally-scalable key-value data repository where it may be accessed using low latency searches. The input data may be compressed into blocks before being stored to minimize storage requirements. The results of searches present input data in its original form. The input data may include access logs, call data records (CDRs), e-mail messages, etc. The system allows a data analyst to efficiently identify information of interest in a very large dynamic data set up to multiple petabytes in size. Once information of interest has been identified, that subset of the large data set can be imported into a dedicated or specialized data analysis system for an additional in-depth investigation and contextual analysis.