The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2014

Filed:

Oct. 05, 2012
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Parasara Sridhar Duggirala, Champaign, IL (US);

Khalil Ghorbal, Pittsburgh, PA (US);

Franjo Ivancic, Princeton, NJ (US);

Vineet Kahlon, Princeton, NJ (US);

Aarti Gupta, Princeton, NJ (US);

Assignee:

NEC Laboratories America, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 99/005 (2013.01); G06N 7/00 (2013.01);
Abstract

Systems and methods for model checking of live systems are shown that include learning an interval discrete-time Markov chain (IDTMC) model of a deployed system from system logs; and checking the IDTMC model with a processor to determine a probability of violating one or more probabilistic safety properties. Checking the IDTMC model includes calculating a linear part exactly using affine arithmetic; and over-approximating a non-linear part using interval arithmetic.


Find Patent Forward Citations

Loading…