The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Nov. 27, 2002
Charles Earl Markham, Appleton, WI (US);
Douglas Gordon Barron Barber, Appleton, WI (US);
Amy Hancock Boyd, Neenah, WI (US);
Gary Lee Goggans, Appleton, WI (US);
John Harland Hise, Neenah, WI (US);
Sheryl Annette Ihde, Greenville, WI (US);
Jeffrey Dean Lindsay, Appleton, WI (US);
Jolene Marie Meissner, DePere, WI (US);
Jamie Scott Mork, Greenville, WI (US);
Kurt Sigurd Nygaard, Appleton, WI (US);
Scott Jeffrey Park, Menasha, WI (US);
Michael Roy Pokorny, Neenah, WI (US);
Walter Caswell Reade, Appleton, WI (US);
John L. Reynders, Appleton, WI (US);
Gregory Duncan Shaffer, Neenah, WI (US);
Roger Dale Yosten, Sumner, TX (US);
Charles Earl Markham, Appleton, WI (US);
Douglas Gordon Barron Barber, Appleton, WI (US);
Amy Hancock Boyd, Neenah, WI (US);
Gary Lee Goggans, Appleton, WI (US);
John Harland Hise, Neenah, WI (US);
Sheryl Annette Ihde, Greenville, WI (US);
Jeffrey Dean Lindsay, Appleton, WI (US);
Jolene Marie Meissner, DePere, WI (US);
Jamie Scott Mork, Greenville, WI (US);
Kurt Sigurd Nygaard, Appleton, WI (US);
Scott Jeffrey Park, Menasha, WI (US);
Michael Roy Pokorny, Neenah, WI (US);
Walter Caswell Reade, Appleton, WI (US);
John L. Reynders, Appleton, WI (US);
Gregory Duncan Shaffer, Neenah, WI (US);
Roger Dale Yosten, Sumner, TX (US);
Binforma Group Limited Liability Company, Dover, DE (US);
Abstract
Providing quality management by validating a bill of materials in event-based product manufacturing. Some of the disclosed embodiments include a system and method for validating materials during manufacture of a product. Also disclosed are a method of validating that acceptable materials are being used on a machine during manufacture of a product, and one or more computer-readable media for storing a data structure representing a product specification in an event-based manufacturing system. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.