The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2014

Filed:

Dec. 24, 2008
Applicant:

Brian Wainscott, San Ramon, CA (US);

Inventor:

Brian Wainscott, San Ramon, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06G 7/48 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5018 (2013.01);
Abstract

A computer-implemented method of simulating an impact event in a finite element analysis used for assisting users to design or improve one or more structures is described. The structures are represented in a finite element analysis model that is divided or partitioned into a plurality of domains. Efficiency of the method is achieved when used in a computer system having multiple processing units and multiple contact interfaces defined and specified by users (engineers and/or scientists). Each domain is associated with or assigned to one of the processing units. A 'group-able' correlation is established or determined between domains and contact interfaces so that data communications can be conducted in most efficient manner, for example, minimizing idle processing units during data communications.


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