The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2014

Filed:

Jun. 20, 2011
Applicants:

Helen Prance, Brighton, GB;

Robert John Prance, Brighton, GB;

Philip Watson, Hove, GB;

Sam Thomas Beardsmore-rust, Portslade, GB;

Inventors:

Helen Prance, Brighton, GB;

Robert John Prance, Brighton, GB;

Philip Watson, Hove, GB;

Sam Thomas Beardsmore-Rust, Portslade, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method and apparatus for the detection of charge density distribution at the surface of a material sample. The apparatus comprises an electric potential sensor for measuring surface charge on a material sample, wherein the electrical potential sensor includes a probe for capacitively coupling the electric potential sensor to the surface of the material sample, an amplifier for generating a measurement output, the probe being connected to an input of the amplifier and the measurement output being supplied at an output of the amplifier, and a feedback arrangement driven from the output of the amplifier for enhancing the input impedance of the amplifier. A positioning system mounts the probe of the electric potential sensor above the material sample and moves the probe at a constant height over a surface of the said sample, and a processing system receives and processes the measurement output of the electric potential sensor for generating a digital record of the charge density distribution at the surface of the material sample.


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